NCAFM2023 Programme Booklet

H I - T ECH I NSTRUMENTS Your Ultimate Strategic Partner

Scanning Ion Conductance Microscopy

Simultaneous SICM and confocal imaging Nanoscale resolution mapping of single cells

Simultaneous SICM and confocal imaging Scaning electrochemical mapping and electrode topography measurements

Simultaneous SICM and confocal imaging

H i

g

s

3

n

D

i

e

p

p

m

p

a

n

p

o

o

r

c

s

S

l

u

a

l

A

p

e

m

e

e

6

s

l l

N

r

C

p

l

C

e

a

m

SICM nanopipette

E l

g

n

e

p i

Confocal volume

c

t

p

r

a

o

c

m

h

l

e

a

m

c

i

S

u

g

r

n

Confocal illumination & detection

i

f

a

g

Scanning ion conductance microscopy (SICM) is a technique which allows non-invasive, real-time examination of cell topography, structure and function under physiological conditions. Nanoscale resolution is achieved through the use of glass nanopipettes which are fabricated using a laser puller. The latest AFM-Raman-SICM system for biological research High-speed scanning microscopy of ionic conduction Non-contact study of living cells in a natural physiological environment Measuring mechanical properties over a wide range of stiffnesses Patch-clamp measurements with nanometer localization Combination with optical techniques

c

a

e

m

I

C

l

o

a

n

c

f

o

Simultaneous SICM and confocal imaging Nanomechanical mapping of molecules live cells with or without applied pressure

Simultaneous SICM and confocal imaging Deposition of biomolecules Local drug dosing

N

a

s

c

n

i

o

n

s

a

c

h

a

c

l

e

e

m

N

n

a

o

i

n

t

i

o

s

s

o

c

p

a

Simultaneous SICM and confocal imaging Combined SICM and pH mapping Oxygen and ROS nanoprobes

e

l

e

d

Simultaneous SICM and confocal imaging Combine SICM and patch clamp measurements

B

g

i

n

o

i

s

s

e

n

S

m

h

c

a

t

r

a

t

P

Website: http://www.htiweb.com General email: sales@htimail.com.my, service@htimail.com.my 25 Bukit Batok Crescent, #05-03, The Elitist, Singapore 658066. Tel: +65 - 6899 9218 Fax: +65 - 6899 0989

AFM in-situ SEM

FusionScope , is an easy-to-use correlative microscopy platform designed from the ground up to add the benefits of SEM imaging to a wide range of AFM measurement techniques. Combine the complementary strengths of AFM and SEM like never before! The FusionScope fully integrates a wide range of advanced AFM measurement techniques with the benefits of SEM imaging. Seamlessly image your sample, identify areas of interest, measure your sample, and combine your imaging data in real time.

Key Applications:

AFM & conductivity measurement: Measure conductivity and topography with pA and nm resolution simultaneously

Correlative microscopy: SEM/FIB and AFM at the same region of interest without breaking vacuum and exposing the sample to air

Topography & elemental analysis Map chemical composition by EDX and correlate it with AFSEM™ 3D topography information

Topography & elemental analysis Map chemical composition by EDX and correlate it with AFSEM™ 3D topography information

Quantum Design Singapore Pte Ltd 160 Robinson Road , #25-06 SBF Center, Singapore 068914 Tel: +65 66762880 / 82625575 info@qd-singapore.com

14

Singapore

www.qd-singapore.com

131