NCAFM2023 Programme Booklet

Oral Session

Oral Session- Session 3 25 th September 2023 (Monday) @ Auditorium

Session Chair: Shijing Tan

Scanning Ion Conductance Microscopy (SICM) for Biological and Material Science Applications

1620 HRS

OR-01-102

Dr Petr Gorelkin ICAPPIC Limited

Frequency and Damping Noise of Atomic Force Microscopy Cantilevers with Optomechanically Modified Quality Factor at Low Temperature

1640 HRS

OR-01-083

Dr Yoichi Miyahara Texas State University

Characterization of Hydrogen Resist Lithography Quantum Dots using AFM

1700 HRS

OR-01-070

Mr Jose Bustamante Physics Department, McGill University

Using Single-Electron Force Microscopy to Determine Enzymatic Electron Transfer Dynamics

1720 HRS

OR-01-072

Ms Catherine Boisvert McGill University

20